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| IPD05N03LA IPS05N03LA IPF05N03LA IPU05N03LA OptiMOS(R)2 Power-Transistor Features * Ideal for high-frequency dc/dc converters * Qualified according to JEDEC for target application * N-channel, logic level * Excellent gate charge x R DS(on) product (FOM) * Superior thermal resistance * 175 C operating temperature 1) Product Summary V DS R DS(on),max (SMD version) ID 25 5.1 50 V m A Type IPD05N03LA IPF05N03LA IPS05N03LA IPU05N03LA Type IPD05N03LA IPF05N03LA Package IPS05N03LA Ordering Code IPU05N03LA Marking Package P-TO252-3-11 P-TO252-3-11 P-TO252-3-23 Q67042-S4144 P-TO251-3-11 05N03LA P-TO251-3-21 Ordering Code Q67042-S4144 P-TO252-3-23 Q67042-S Q67042-S4194 Q67042-S 05N03LA Q67042-S4230 Marking 05N03LA 05N03LA P-TO251-3-11 05N03LA Q67042-S 05N03LA 05N03LA P-TO251-3-21 Q67042-S4230 05N03LA Maximum ratings, at T j=25 C, unless otherwise specified Parameter Continuous drain current Symbol Conditions ID T C=25 C2) T C=100 C Pulsed drain current Avalanche energy, single pulse Reverse diode dv /dt Gate source voltage4) Power dissipation Operating and storage temperature IEC climatic category; DIN IEC 68-1 I D,pulse E AS dv /dt V GS P tot T j, T stg T C=25 C T C=25 C3) I D=45 A, R GS=25 I D=50 A, V DS=20 V, di /dt =200 A/s, T j,max=175 C Value 50 50 350 300 6 20 94 -55 ... 175 55/175/56 mJ kV/s V W C Unit A Rev. 1.5 page 1 2004-03-30 IPD05N03LA IPS05N03LA Parameter Symbol Conditions min. Thermal characteristics Thermal resistance, junction - case SMD version, device on PCB R thJC R thJA minimal footprint 6 cm2 cooling area5) Electrical characteristics, at T j=25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage Gate threshold voltage Zero gate voltage drain current V (BR)DSS V GS=0 V, I D=1 mA V GS(th) I DSS V DS=V GS, I D=50 A V DS=25 V, V GS=0 V, T j=25 C V DS=25 V, V GS=0 V, T j=125 C Gate-source leakage current Drain-source on-state resistance I GSS R DS(on) V GS=20 V, V DS=0 V V GS=4.5 V, I D=30 A V GS=4.5 V, I D=30 A, SMD version V GS=10 V, I D=30 A V GS=10 V, I D=30 A, SMD version Gate resistance Transconductance RG g fs |V DS|>2|I D|R DS(on)max, I D=30 A 25 1.2 1.6 0.1 Values typ. IPF05N03LA IPU05N03LA Unit max. 1.6 75 50 K/W 2 1 V A 31 10 10 6.9 6.7 4.4 4.2 1 62 100 100 8.6 8.4 5.3 5.1 S nA m 1) 2) J-STD20 and JESD22 Current is limited by bondwire; with an R thJC=1.6 K/W the chip is able to carry 106 A. See figure 3 T j,max=150 C and duty cycle D <0.25 for V GS<-5 V 3) 4) 5) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (one layer, 70 m thick) copper area for drain connection. PCB is vertical in still air. Rev. 1.5 page 2 2004-03-30 IPD05N03LA IPS05N03LA Parameter Symbol Conditions min. Dynamic characteristics Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Gate Charge Characteristics6) Gate to source charge Gate charge at threshold Gate to drain charge Switching charge Gate charge total Gate plateau voltage Gate charge total, sync. FET Output charge Reverse Diode Diode continous forward current Diode pulse current Diode forward voltage IS I S,pulse V SD T C=25 C V GS=0 V, I F=50 A, T j=25 C V R=15 V, I F=I S, di F/dt =400 A/s 0.91 Q gs Q g(th) Q gd Q sw Qg V plateau Q g(sync) Q oss V DS=0.1 V, V GS=0 to 5 V V DD=15 V, V GS=0 V V DD=15 V, I D=25 A, V GS=0 to 5 V 7.6 3.9 5.2 9.0 19 3.2 17 20 C iss C oss Crss t d(on) tr t d(off) tf V DD=15 V, V GS=10 V, I D=25 A, R G=2.7 V GS=0 V, V DS=15 V, f =1 MHz 2413 921 112 10 7.8 31 4.8 Values typ. IPF05N03LA IPU05N03LA Unit max. 3110 1225 167 15 12 38 6.0 pF ns 10 5.0 7.8 13 25 22 27 nC V nC 50 350 1.2 A V Reverse recovery charge Q rr - - 10 nC 6) See figure 16 for gate charge parameter definition Rev. 1.5 page 3 2004-03-30 IPD05N03LA IPS05N03LA 1 Power dissipation P tot=f(T C) 2 Drain current I D=f(T C); V GS10 V IPF05N03LA IPU05N03LA 100 90 80 70 60 60 50 40 P tot [W] I D [A] 50 40 30 20 10 0 0 50 100 150 200 30 20 10 0 0 50 100 150 200 T C [C] T C [C] 3 Safe operation area I D=f(V DS); T C=25 C; D =0 parameter: t p 1000 4 Max. transient thermal impedance Z thJC=f(t p) parameter: D =t p/T 10 limited by on-state resistance 1 s 10 s 100 1 0.5 DC 1 ms Z thJC [K/W] 100 s I D [A] 0.2 0.1 0.05 10 10 ms 0.1 0.02 0.01 single pulse 1 0.1 1 10 100 0.01 0 0 0 0 0 0 1 10-6 10-5 10-4 10-3 10-2 10-1 100 V DS [V] t p [s] Rev. 1.5 page 4 2004-03-30 IPD05N03LA IPS05N03LA 5 Typ. output characteristics I D=f(V DS); T j=25 C parameter: V GS 100 10 V IPF05N03LA IPU05N03LA 6 Typ. drain-source on resistance R DS(on)=f(I D); T j=25 C parameter: V GS 20 90 80 70 60 4.5 V 4.1 V 18 16 3.8 V 3V 3.2 V 3.5 V 3.8 V 4.1 V 14 R DS(on) [m] 12 10 8 6 I D [A] 50 3.5 V 40 30 3.2 V 4.5 V 20 3V 4 2 0 0 1 2 3 0 20 40 60 80 10 V 10 0 2.8 V 100 V DS [V] I D [A] 7 Typ. transfer characteristics I D=f(V GS); |V DS|>2|I D|R DS(on)max parameter: T j 100 8 Typ. forward transconductance g fs=f(I D); T j=25 C 80 70 80 60 50 60 g fs [S] 40 20 175 C 25 C I D [A] 40 30 20 10 0 0 0 1 2 3 4 5 0 10 20 30 40 50 60 V GS [V] I D [A] Rev. 1.5 page 5 2004-03-30 IPD05N03LA IPS05N03LA 9 Drain-source on-state resistance R DS(on)=f(T j); I D=30 A; V GS=10 V 10 Typ. gate threshold voltage V GS(th)=f(T j); V GS=V DS parameter: I D 10 9 8 7 2 2.5 IPF05N03LA IPU05N03LA 500 A 98 % R DS(on) [m] 6 5 4 3 2 1 0 -60 -20 20 V GS(th) [V] 1.5 50 A typ 1 0.5 0 60 100 140 180 -60 -20 20 60 100 140 180 T j [C] T j [C] 11 Typ. capacitances C =f(V DS); V GS=0 V; f =1 MHz 12 Forward characteristics of reverse diode I F=f(V SD) parameter: T j 10000 1000 Ciss 1000 Coss 100 25 C 175 C 175 C, 98% C [pF] Crss I F [A] 25 C, 87% 100 10 10 0 5 10 15 20 25 30 1 0.0 0.5 1.0 1.5 2.0 V DS [V] V SD [V] Rev. 1.5 page 6 2004-03-30 IPD05N03LA IPS05N03LA 13 Avalanche characteristics I AS=f(t AV); R GS=25 parameter: T j(start) 100 IPF05N03LA IPU05N03LA 14 Typ. gate charge V GS=f(Q gate); I D=25 A pulsed parameter: V DD 12 15 V 10 150 C 100 C 25 C 5V 20 V 8 10 V GS [V] 1 10 100 1000 I AV [A] 6 4 2 1 0 0 20 40 t AV [s] Q gate [nC] 15 Drain-source breakdown voltage V BR(DSS)=f(T j); I D=1 mA 16 Gate charge waveforms 29 V GS 28 27 26 Qg V BR(DSS) [V] 25 24 23 22 21 20 -60 -20 20 60 100 140 180 V g s(th) Q g (th) Q gs Q sw Q gd Q gate T j [C] Rev. 1.5 page 7 2004-03-30 IPD05N03LA IPS05N03LA Package Outline P-TO252-3-11: Outline IPF05N03LA IPU05N03LA Footprint: Packaging: Dimensions in mm Rev. 1.5 page 8 2004-03-30 IPD05N03LA IPS05N03LA Package Outline P-TO252-3-23: Outline IPF05N03LA IPU05N03LA Footprint: Dimensions in mm Rev. 1.5 page 9 2004-03-30 IPD05N03LA IPS05N03LA Package Outline P-TO251-3-11: Outline IPF05N03LA IPU05N03LA P-TO251-3-21: Outline Dimensions in inch [mm] Rev. 1.5 page 10 2004-03-30 IPD05N03LA IPS05N03LA Published by Infineon Technologies AG Bereich Kommunikation St.-Martin-Strae 53 D-81541 Munchen (c) Infineon Technologies AG 1999 All Rights Reserved. IPF05N03LA IPU05N03LA Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices, please contact your nearest Infineon Technologies office in Germany or our Infineon Technologies representatives worldwide (see address list). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact your nearest Infineon Technologies office. Infineon Technologies' components may only be used in life-support devices or systems with the expressed written approval of Infineon Technologies if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1.5 page 11 2004-03-30 |
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